Items where Author is "Tenentes, Vasileios"

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Article

Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. (2018) Vasileios Tenentes, Daniele Rossi, Saqib Khursheed, Bashir M. Al-Hashimi and Krishnendu Chakrabarty

Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories. (2017) Daniele Rossi, Vasileios Tenentes, Sudhakar M. Reddy, Bashir M. Al-Hashimi and Andrew Brown

Susceptible Workload Evaluation and Protection using Selective Fault Tolerance. (2017) Mauricio D. Gutierrez, Vasileios Tenentes, Daniele Rossi and Tom J. Kazmierski

Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure. (2017) Vasileios Tenentes, Daniele Rossi, Sheng Yang, Saqib Khursheed, Bashir M. Al-Hashimi and Steve R. Gunn picture_as_pdf

The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. (2016) Basel Halak, Vasileios Tenentes and Daniele Rossi

Aging Benefits in Nanometer CMOS Designs. (2016) Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed and Bashir M. Al-Hashimi

Reliable Power Gating With NBTI Aging Benefits. (2016) Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed and Bashir M. Al-Hashimi